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Ilknur Cavusoglu, M.Numan Durakbasa, P. Herbert Osanna

PROCESS PERFORMANCE EVALUATION AND IMPROVEMENT FOR THE QUALITY PROGRESS IN THE INDUSTRIAL MANUFACTURING SYSTEMS

Saulius Kaušinis, Aurimas Jakštas, Rimantas Barauskas, Albinas Kasparaitis

INVESTIGATION OF DYMANIC PROPERTIES OF LINE SCALE CALIBRATION SYSTEMS

Bartosz Gapinski, Miroslaw Grzelka, Miroslaw Rucki

SOME ASPECTS OF THE ROUNDNESS MEASUREMENT WITH CMM

Kazuhiro Ishizu, Akihito Takahashi, Tomoyuki Miyazaki, Kentaro Nemoto

MINUTE FORM MEASURING SYSTEM

Antonio Piratelli-Filho, Geraldo G. Soares-Neto

ERROR EVALUATION OF SECONDARY FREE FORM SURFACES IN COMPLEX PART MEASUREMENT

Dariusz Janecki, Stanisław Adamczak, Marek Cabaj

DETERMINING THE CHARACTERISTICS OF SENSORS DISPLACEMENT IN INSTRUMENTS FOR ROUNDNESS MEASUREMENTS

Cristian Fosalau, Emil Vremera, Marinel Temneanu, Mihai Cretu

USING THE GMI EFFECT FOR DETECTING SMALL ROTATIONAL MOVEMENTS

Ichiko Misumi, Satoshi Gonda, Osamu Sato, Kentaro Sugawara, Kazunori Yoshizaki, Qiangxian Huang, Tomizo Kurosawa, Toshiyuki Takatsuji

DESIGN AND FABRICATION OF NANOMETRIC LATERAL SCALE CONSISTING OF GaAs/InGaP SUPERLATTICE

Michael Balke, Erwin Peiner, Lutz Doering

CANTILEVER STRUCTURES FOR MEASURING MICROSTRUCTURED SURFACES OF MACRO AND MICRO COMPONENTS

Albert Weckenmann, Jörg Hoffmann

CONSTRUCTION AND EVALUATION OF A TRACEABLE METROLOGICAL LONG RANGE SCANNING TUNNELING MICROSCOPE

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