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Felix Sharipov, Guilherme Bertoldo

NUMERICAL MODELLING OF PIRANI SENSOR

Paulo R. G. Couto, Luiz Henrique Paraguassu, Leonardo Rodrigues Cinelli, Ilca Lopes.Bezerra, Isabela Wanderley Alves, Walmir Sérgio da Silva

VERIFICATION OF THE CONVERGENCE BETWEEN ISO GUM 95 vs MONTE CARLO METHOD REGARDING THE EXPANDAD UNCERTAINTY AT THE PRESSURE LABORATORY IN BRAZIL

B. Dhanasekar, B. Ramamoorthy

SURFACE ROUGHNESS EVALUATION OF CYLINDRICAL MACHINED SURFCAES

Bartosz Gapinski, Miroslaw Grzelka, Miroslaw Rucki

THE ACCURACY ANALYSIS OF THE ROUNDNESS MEASUREMENT WITH COORDINATE MEASURING MACHINES

Rodrigo Riquelme, Ignacio Lira, Carlos Pérez-López, Juan A. Rayas, Ramón Rodríguez-Vera

INTERFEROMETRIC MEASUREMENT OF A DIFFUSION COEFFICIENT

Leonardo Massunari Lieu, Agenor de Toledo Fleury

PROJECT OF A MICROPOSITIONING SYSTEM FOR A ROUNDNESS MEASURING MACHINE

Matías Roberto Viotti, Armando Albertazzi G. Jr., Ricardo Suterio

A MICHELSON INTERFEROMETER AS A CALIBRATION TOOL OF A RADIAL IN-PLANE DIGITAL SPECKLE INTERFEROMETER

Yong-Hak Huh, Dong-Iel Kim,Chang-Doo Kee

ESPI TECHNQIUE FOR MEASURING MICRO-TENSILE PROPERTIES OF THIN FILM MATERIALS

Gilder Nader, Paulo Tiago Fracasso, Paulo José Saiz Jabardo, José Pucci Caly, Wagner Cesar Bruna, Flavius Portella Ribas Martins, Eduardo Ferrara, Mikiya Muramatsu, Niklauss UrsusWetter, Marcos Tadeu Pereira

A LOW COST PARTICLE IMAGE VELOCIMETRY

Gilder Nader, Ronny Calixto Carbonari, Emílio Carlos Nelli Silva

EXPERIMENTAL AND NUMERICAL CHARACTERIZATION OF XY PIEZOELECTRIC NANOPOSITIONERS

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