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MINUTE FORM MEASURING SYSTEM

Kazuhiro Ishizu, Akihito Takahashi, Tomoyuki Miyazaki, Kentaro Nemoto
  • Abstract:
    According to the progress of industrial products, high-accuracy and minute parts are increasing rapidly. As one of the desired measuring systems for accurately and efficiently evaluating the 3D form of these mass-production minute form parts, an evaluation system constructed by combining "a high-accuracy stage", "minute probes" and "an optical unit" is described.
  • Keywords:
    Measuring instrument, Minute form measurement, Probe, Low measuring force
  • Download:
  • DOI:
    _unreg_wc-2006.TC14-027

Event details:

  • IMEKO TC:
  • Event name:
    XVIII IMEKO World Congress
  • Title:

    Metrology for a Sustainable Development

  • Place:
    Rio de Janeiro, BRAZIL
  • Time:
    17 September 2006 - 22 September 2006