Skip to main content
Home
About
Technical Committees
Events
Publications
Proceedings
Acta IMEKO
Newsletter
News
Events
Coming Events
IMEKO Event portal
Recent Events
World Congresses
Co-sponsorships
Other Events
Publications
Ethics and Malpractice
Copyright permission
Proceedings
Acta IMEKO
Newsletters
Awards
György Striker Junior Paper Award
Distinguished Service Award
Best Acta IMEKO Reviewer Award
External Awards to IMEKO
Links
Search
Login
Home
About
Technical Committees
TC1
TC2
TC3
TC4
TC5
TC6
TC7
TC8
TC9
TC10
TC11
TC12
TC13
TC14
TC15
TC16
TC17
TC18
TC19
TC20
TC21
TC22
TC23
TC24
TC25
TC26
Events
Coming Events
IMEKO's Event portal
Recent Events
World Congresses
2009, Lisbon
2006, Rio de Janeiro
2003, Dubrovnik
Co-sponsorships
Other Events
Publications
Ethics & Malpractice
Copyright permission
Proceedings
Acta IMEKO
Newsletter
Search Proceedings
Proceedings
Giampaolo E. D’Errico
TREATMENT OF OUTLIERS IN IN-PROCESS APPLICATIONS: A ROC-BASED APPROACH
Paul-Gerald Dittrich, Dietrich Hofmann
PHOTONIC MICRO SENSORS FOR MOBILE COLOR AND SPECTRAL CHARACTERIZATION OF COLORED LIQUIDS IN LABORATORIES AND IN FIELD
André Luiz Meira de Oliveira, André Ferreira, Gustavo Daniel Donatelli
IMPLEMENTATION OF A R&D&I NETWORK IN METROLOGY FOR LARGE CORPORATIONS - PETROBRAS CASE STUDY
I. Frollo, A. Krafčík, P. Andris, J. Přibil, T. Dermek
PLANAR MAGNETOSTATIC MODEL OF SOFT MAGNETIC OBJECTS IN HOMOGENEOUS MAGNETIC FIELD OF AN NMR IMAGER
V. A. Granovskii
SINGLE-CHANNEL MEASURING INFORMATION SYSTEM: METROLOGICAL DESCRIPTION AND NORMALIZATION
Maxim Puchnin, Františka Pešlová
EXPRESS AUTOMATED BALL INDENTATION MEASUREMENT OF MATERIAL PROPERTIES
Pakkratoke Montree, Tassanai Sanponpute
SYSTEMATIC ERROR OF LOADCELL TYPE ROCKWELL HARDNESS TESTING MACHINE ON ROCKWELL SCALE R
Tassanai Sanponpute, Wasin Limthunyalak, Febo Menelao, Dieter Schwenk
VICKERS INDENTER SHAPE MEASUREMENT BY USING SCANNING CONFOCAL CHROMATIC INSTRUMENT
John Song, Samuel Low, Thomas B. Renegar, Li Ma
DEVELOPING NIST ROCKWELL HARDNESS DIAMOND INDENTER SRMS BASED ON ISO 6508-3:2015 STANDARD
Nae Hyung Tak, Gun Woong Bahng, Tag Gyu Kim
VERIFICATION RESULTS OF LEEB HARDNESS INDICATING DEVICES FROM DIFFERENT MANUFACTURERS USING THE LEEB HARDNESS REFERENCE VOLTAGE SIGNAL
1
…
337
338
339
340
341
342
343
…
948