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William Dinis Camara, Steven Choquette, Katya Delak, Robert Hanisch, Benjamin Long, Melissa Phillips, Jared M. Ragland, Catherine Rimmer
THE DIGITAL NIST: CHALLENGES AND OPPORTUNITIES IN THE DIGITAL TRANSFORMATION OF NIST’S REFERENCE MATERIALS
Oksana Baer, Claudiu Giusca, Rolf Kumme, Andrea Prato, Jonas Sander, Davood Mirian, Frank Hauschild
DIGITAL TWIN CONCEPT FOR FORCE METROLOGY SERVICES
Shanna Schönhals, Lutz Doering, Benjamin Gloger, Siegfried Hackel, Frank Härtig, Daniel Hutzschenreuter, Justin Jagieniak, Thomas Krah, Jan Loewe, Thorsten Schrader, Gamze Söylev Öktem
RECENT ADVANCES OF THE LONG-TERM AVAILABLE DCC SCHEMA VERSION 3
Benjamin Gloger, Lutz Doering, Siegfried Hackel, Justin Jagieniak, Gamze Söylev Öktem
INPUT MANAGEMENT FOR THE DCC
Muhammed-Ali Demir, Moritz Jordan, Thomas Krah, Shanna Schönhals, Siegfried Hackel, Frank Härtig, Thorsten Schrader, Jan Loewe, Lutz Doering, Benjamin Gloger, Justin Jagieniak, Gamze Söylev-Öktem
A HUMAN READABLE FORM OF THE DCC
Conor McBride, Georgi Nakov, Fredrik Nordvall Forsberg
EXPRESSIVE TYPE SYSTEMS FOR METROLOGY
Anupam Prasad Vedurmudi, Katharina Janzen, Sascha Eichstädt
UNCERTAINTY-AWARE ROOM-TEMPERATURE PROFILE ESTIMATION USING ORDINARY KRIGING
Mark Kuster
IMPLEMENTING AN M-LAYER DATA MODEL
Hiroshi Watanabe
SPECIFICATION FOR AUDIT TRAIL IN OIML D31: TOWARD RUNTIME VERIFICATION
Martin Nicklich, Michael Mende
FROM DIGITAL DEVICE UNDER TEST TO DIGITAL CALIBRATION CERTIFICATE. CHALLENGES AND SOLUTIONS FOR THE CALIBRATION OF MEASURING INSTRUMENTS AND SENSORS IN THE DIGITAL FUTURE
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