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Yong-Hak Huh, Dong-Iel Kim,Chang-Doo Kee

ESPI TECHNQIUE FOR MEASURING MICRO-TENSILE PROPERTIES OF THIN FILM MATERIALS

Gilder Nader, Paulo Tiago Fracasso, Paulo José Saiz Jabardo, José Pucci Caly, Wagner Cesar Bruna, Flavius Portella Ribas Martins, Eduardo Ferrara, Mikiya Muramatsu, Niklauss UrsusWetter, Marcos Tadeu Pereira

A LOW COST PARTICLE IMAGE VELOCIMETRY

Gilder Nader, Ronny Calixto Carbonari, Emílio Carlos Nelli Silva

EXPERIMENTAL AND NUMERICAL CHARACTERIZATION OF XY PIEZOELECTRIC NANOPOSITIONERS

Tokihiko Kobata

MEASUREMENT OF EFFECTIVE AREA RATIO OF GAS AND HYDRAULIC PRESSURE BALANCES

G. Buonanno, G. Giovinco, G. Molinar Min Beciet, P. Delajoud, R. Haines

A FEM ANALYSIS OF A NEGATIVE FREE DEFORMATION PRESSURE BALANCE OPERATING UP TO 100 MPa

G. Jäger, T. Hausotte, E. Manske, H.-J. Büchner, R. Mastylo, N. Dorozhovets, N. Hofmann

NANOMEASURING AND NANOPOSITIONING ENGINEERING

Miroslaw Grzelka, Bartosz Gapinski

RECOMMENDATIONS ON THE MEASUREMENT OF CYLINDRICAL GEARS WITH COORDINATE MEASURING MACHINES

Han-Young Ryu, Won-Kyu Lee, Han-Seb Moon, Chu-Shik Kang, Ho-Suhng Suh

A NOVEL DILATOMETER FOR MEASURING COEFFICIENT OF THERMAL EXPANSION OF ULE-MATERIAL USING A FIBER RING LASER

Alexandre Titov, Igor Malinovsky

HIGH-PRECISION TEMPERATURE MEASUREMENTS OF MATERIAL ARTIFACTS

Jean Mailhé, Jean-Marc Linares, Jean-Michel Sprauel

VERIFICATION BY VIRTUAL GAUGE USING A STATISTICAL CRITERION

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