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C. Yin, J. Qian, J. Wang, C. Shi

LASER FOCUSING OF CHROMIUM ATOMS

Muzheng Xiao, Tomohiko Takamura, Satoru Takahashi, Kiyoshi Takamasu

NANOMETER PROFILE MEASUREMENT OF LARGE ASPHERIC OPTICAL SURFACE WITH IMPROVED DEFLECTOMETRY METHOD - PRINCIPLE INTRODUCTION AND EXPERIMENTAL VERIFICATION -

Hyun Mo Cho, Won Chegal, Yong Jai Cho, Jong Myoung Won, Moonseob Jin, Daesuk Kim

AN ELLIPSOMETRIC SURFACE PLASMON RESONANCE SENSOR FOR THE DIRECT MONITORING OF SMALL-MOLECULAR-WEIGHT ANALYTES

I. Malinovsky, R. S. Franca, I. B. Couceiro, M. S. Lima, C. L. S. Azeredo, C. M. S. Almeida, J. P. Weid

PRIMARY IMAGING INTERFERENCE MICROSCOPE FOR NANOMETROLOGY

Wondong Kim, Sangsun Lee, Chanyong Hwang

CHARACTERIZATION OF MAGNETIC PROBES USING SCANNING ELECTRON MICROSCOPY WITH POLARIZATION ANALYSIS

Xiangchao Zhang, Min Xu, Hao Zhang, Xiaoying He, Xiangqian Jiang

CHEBYSHEV FITTING OF COMPLEX SURFACES FOR PRECISION METROLOGY

Hoang D. Minh, Alistair B. Forbes

NEW METHOD FOR FREE-FORM SURFACE FITTING IN PRECISION METROLOGY

R. Majchrowski, Lidia Marciniak

DIFFERENCE OF PROFILE PARAMETERS DUE TO ERRORS OF POINTS COLLECTIONS – SIMULATION ANALYSIS

PROFICIENCY TESTING FOR CALIBRATION LABORATORIES

Klaus-Dieter Sommer, Petra Spitzer, Volker Ebert

NEW CHALLENGES IN ENVIRONMENTAL METROLOGY

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