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ULTRA-LOW NOISE TWO CHANNEL NOISE MEASUREMENT SYSTEM
A. Konczakowska, L. Hasse, L. Spiralski
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Abstract:The computer-controlled system for low-frequency noise measurements has been presented. All major functions for adequate polarisation of a device under test are programmable providing complete flexibility and automation for biasing. The inherent noise parameters of the main modules are enclosed. The system enables to measure input-output noise relations for BJTs, JFETs, MOSFETs, MESFETs, HEMTs, and, in general, also other two-ports.
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Keywords:low-frequency noise, noise measurements, low- noise preamplifiers, automation of noise measurement
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Download:
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DOI:_unreg_wc-2000.136
Event details:
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IMEKO TC:
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Event name:XVI IMEKO World Congress
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Title:
Measurement - Supports Science - Improves Technology - Protects Environment ... and Provides Employment - Now and in the Future
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Place:Vienna, AUSTRIA
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Time:25 September 2000 - 28 September 2000