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Hiroaki Nishioka, Satoru Takahashi, Kiyoshi Takamasu

A SUPER-RESOLUTION MICROSCOPY WITH STANDING EVANESCENT LIGHT AND IMAGE RECONSTRUCTION METHOD

Robert Schmitt, Tilo Pfeifer, Alexandre Orth

FEASIBLE PRODUCTION OF FIBRE-REINFORCED COMPOSITES THROUGH INLINE INSPECTION WITH MACHINE VISION

Klaus Körner, Evangelos Papastathopoulos, Wolfgang Osten

SOME ASPECTS OF CHROMATIC CONFOCAL SPECTRAL INTERFEROMETRY

Eugen-Georg Woschni

DEVELOPMENTS OF MEASUREMENT DUE TO TENDENCIES OF MICROELECTRONICS AND A NEW OPTIMIZATION CRITERION

S. Patzelt, F. Horn, G. Goch

FAST INTEGRAL OPTICAL ROUGHNESS MEASUREMENT OF SPECULAR REFLECTING SURFACES IN THE NANOMETER RANGE

Albert Weckenmann, Sebastian Beetz

TRAINING IN COORDINATE METROLOGY EUKOM: MADE IN EUROPE - OPEN TO THE WORLD

Michaël Demeyere, Christian Eugène

LASER TRIANGULATION UNDER STRUCTURED LIGHTING: A DIDACTIC TRAINING SESSION

Albert Weckenmann, Teresa Werner

TRAINING ON BASICS FOR INDUSTRIAL METROLOGY BY INTEGRATION OF WORK AND LEARNING IN THE PROJECT MESS-IN

Sylvio Jr. Machado, Marco Antonio Cavaco

AN INTERACTIVE TOOL FOR TEACHING METROLOGY

Valery A. Granovsky, Marian Jerzy Korczynski

TEACHING MEASUREMENT AND INSTRUMENTATION: SYSTEMATIC APPROACH

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