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I. Malinovsky, R. S. Franca, I. B. Couceiro, M. S. Lima, C. L. S. Azeredo, C. M. S. Almeida, J. P. Weid

PRIMARY IMAGING INTERFERENCE MICROSCOPE FOR NANOMETROLOGY

Wondong Kim, Sangsun Lee, Chanyong Hwang

CHARACTERIZATION OF MAGNETIC PROBES USING SCANNING ELECTRON MICROSCOPY WITH POLARIZATION ANALYSIS

Xiangchao Zhang, Min Xu, Hao Zhang, Xiaoying He, Xiangqian Jiang

CHEBYSHEV FITTING OF COMPLEX SURFACES FOR PRECISION METROLOGY

Hoang D. Minh, Alistair B. Forbes

NEW METHOD FOR FREE-FORM SURFACE FITTING IN PRECISION METROLOGY

R. Majchrowski, Lidia Marciniak

DIFFERENCE OF PROFILE PARAMETERS DUE TO ERRORS OF POINTS COLLECTIONS – SIMULATION ANALYSIS

PROFICIENCY TESTING FOR CALIBRATION LABORATORIES

Klaus-Dieter Sommer, Petra Spitzer, Volker Ebert

NEW CHALLENGES IN ENVIRONMENTAL METROLOGY

Suyong Kwon, Yong-Gyoo Kim,Sanghyun Lee, Jong Chul Kim

MEASUREMENT OF THE FIGURE-OF-MERIT OF THERMOELECTRIC DEVICES

GLOBAL SYSTEM OF UNIVERSAL TIME BASED ON RECEIVING SIGNALS FROM PERIODICAL PULSATING STARS

Behrang H. Hamadani, John Roller, Brian Dougherty, Howard W Yoon

LIGHT-EMITTING-DIODE-BASED FOURIER-TRANSFORM SPECTRAL RESPONSE MEASUREMENT SYSTEM FOR PHOTOVOLTAIC CHARACTERIZATIONS

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