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Jonghan Jin, Yong-Bong Lee, Jae Wan Kim, Jong-Ahn Kim, Chu-Shik Kang

A MODIFIED VISIBILITY ENHANCED INTERFEROMETER FOR MEASURING ROUGH SURFACES BASED ON AN INJECTION LOCKING TECHNIQUE

Saerom Maeng, Jieun Kim, Jonghan Jin, Jae Wan Kim, Jong-Ahn Kim

DESIGN AND FABRICATION OF A STEP HEIGHT CERTIFICATED REFERENCE MATERIAL IN KRISS

Jungjae Park, Saerom Maeng, Jae Wan Kim, Jong-Ahn Kim, Jonghan Jin

UNCERTAINTY IMPROVEMENT OF GEOMETRICAL THICKNESS MEASUREMENT OF A SILICON WAFER USING A FEMTOSECOND PULSE LASER

A SIMPLE METHOD OF 2D AND 3D PROFILE FILTERING USING B-SPLINE APPROXIMATION

Cristian S. Castillo, Maurício N. Frota, Ignácio Lira

UNCERTAINTY IN MEASUREMENT: A KEY CRITERION FOR DEFINING THE COVERAGE FACTOR ASSOCIATED WITH THE MANUFACTURING PROCESS OF WOVEN FABRICS

H. Fujimoto, Watanabe

HIGH-RESOLUTION AUTOCOLLIMATOR CALIBRATION SYSYTEM

CAPABILITY OF MEASUREMENT PROCESSES BASED ON ISO/FDIS 22514-7 AND VDA 5

C. R. Baldo, D. M. Yamanaka, D. C. B. Silva

TACTILE-OPTICAL MICROPROBES APPLIED TO DIMENSIONAL MEASUREMENT AND EVALUATION OF MICROFEATURES

Dong Wei, Kiyoshi Takamasu, Hirokazu Matsumoto

COMPARISON EXPERIMENT FOR PULSE REPETITION INTERVAL BASED LENGTH MEASUREMENT LINKED TO A FEMTOSECOND OPTICAL FREQUENCY COMB

EXPERIMENTAL EVALUATION OF CMM TOUCH PROBING SYSTEM

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