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U. Neuschaefer-Rube, W. Holzapfel, F. Wirth

TARGET ANALYSIS BY FOCUSING ELLIPSOMETRY

S. Neuschaefer-Rube, W. Holzapfel, L. Hou

SIGNAL PROPERTIES OF MONOLITHIC ND:YAG LASERS

W. Osten, D. Kayser, W. Jüptner

AN ACTIVE APPROACH FOR HIGH RESOLUTION MEASUREMENT OF TECHNICAL SURFACES

T. Pohl, B. Schmitz

APPLICATIONS OF SHORT COHERENCE INTERFEROMETRY

O. Postolache, M.D. Pereira, P. Girão, M. Cretu

AN OPTICAL DISPLACEMENT METER BASED ON A LIGHT-TO- FREQUENCY CONVERTER

F. Bitte, H. Mischo, T. Pfeifer, G. Frankowski

3D SURFACE INSPECTION WITH A DMD BASED SENSOR

S. Brinkmann, T. Dresel, R. Schreiner, J. Schwider

THE DIFFRAXICON-INTERFEROMETER FOR CYLINDER TESTS

Y. V. Chugui, A. A. Pavlov

PECULIARITIES OF CYLINDER DIAMETER DETERMINATION BY DIFFRACTION METHOD

A. Cysewska-Sobusiak, G. Wiczynski

EMISSION OF MEASURING SIGNALS WITH PULSE-DRIVEN LEDs

Y. Deguchi, S. Iwasaki, K. Yoshikawa, H. Moritomi, K. Matsumoto

LIBS APPLICATION FOR THERMAL PLANTS MONITORING

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