Skip to main content
Home
About
Technical Committees
Events
Publications
Proceedings
Acta IMEKO
Newsletter
News
Events
Coming Events
IMEKO Event portal
Recent Events
World Congresses
Co-sponsorships
Other Events
Publications
Ethics and Malpractice
Copyright permission
Proceedings
Acta IMEKO
Newsletters
Awards
György Striker Junior Paper Award
Distinguished Service Award
Best Acta IMEKO Reviewer Award
External Awards to IMEKO
Links
Search
Login
Home
About
Technical Committees
TC1
TC2
TC3
TC4
TC5
TC6
TC7
TC8
TC9
TC10
TC11
TC12
TC13
TC14
TC15
TC16
TC17
TC18
TC19
TC20
TC21
TC22
TC23
TC24
TC25
TC26
Events
Coming Events
IMEKO's Event portal
Recent Events
World Congresses
2024, Hamburg
2009, Lisbon
2006, Rio de Janeiro
2003, Dubrovnik
Co-sponsorships
Other Events
Publications
Ethics & Malpractice
Copyright permission
Proceedings
Acta IMEKO
Newsletter
Search Proceedings
Proceedings
Jacek Gogól
THERMAL ISSUES IN MACHINE TOOLS AND COORDINATE MEASURING MACHINE SIMILARITIES AND DIFFERENCES.
Piotr Grudowski, Malgorzata Wisniewska, Ewa Zajkowska-Leseure
NEEDS AND PROBLEMS OF SMES IN THE CONTEXT OF LEAN SIX SIGMA METHODOLOGY. FRENCH AND POLISH PERSPECTIVE
Ryszard Jablonski
SINGLE PHOTON BEAM AS A TOOL FOR MEASURING MICRO- AND NANOOBJECTS
Francisco A. Arenhart, Vitor C. Nardelli, Gustavo D. Donatelli, Mauricio C. Porath, Christopher Isenberg, Robert Schmitt
DESIGN OF A MULTI-WAVE STANDARD TO EVALUATE THE FREQUENCY RESPONSE OF CT MEASURING SYSTEMS
Liam Blunt, Mohamed Elrawemi, Leigh Fleming, Haydn Martin, Hussam Muhamedsalih, David Robbins
DEVELOPMENT OF THE BASIS FOR IN PROCESS METROLOGY FOR ROLL TO ROLL PRODUCTION OF FLEXIBLE PHOTO VOLTAICS
Ulrich Neuschaefer-Rube, Michael Neugebauer, Thorsten Dziomba, Hans-Ulrich Danzebrink, Ludger Koenders, Harald Bosse
NEW DEVELOPMENTS OF MEASUREMENT STANDARDS AND PROCEDURES FOR MICRO AND NANOMETROLOGY AT THE PTB
Zbigniew Humienny, Marcin Berta
USING ANIMATIONS TO SUPPORT THE UNDERSTANDING OF GEOMETRICAL TOLERANCING CONCEPTS
Krzysztof STEPIEN
VERIFICATION OF THE CONCEPT OF SPHERICITY MEASUREMENTS BY THE RADIAL METHOD UNDER INDUSTRIAL CONDITIONS
Ryoshu Furutani, Tsutomu Itabash, Miyu Ozaki
COMPARISON OF DAILY CHECK ARTEFACTS OF CMM
Jianbo Yu
A REVIEW FOR MANIFOLD LEARNING-BASED STATISTICAL PROCESS CONTROL
1
…
473
474
475
476
477
478
479
…
977