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Lao Dabao, Zhou Weihu, Li Wanghong, Shi Dong
MULTI-READING HEAD CYLINDRICAL GRATING ANGLE ERROR COMPENSATION BASED ON HARMONIC ANALYSIS
Ji Qi, Yingzhong Tian, Wenjun Zhang, Albert Weckenmann, Minglun Fang
3D SURFACE MICRO TOPOGRAPHY RECOVERY FROM MULTI-FOCUS IMAGES USING MODIFIED LAPLACIAN OPERATOR
Qinghua Wang, Hiroshi Tsuda, Satoshi Kishimoto, Yoshihisa Tanaka, Yutaka Kagawa
THREE MOIRÉ TECHNIQUES UNDER A LASER SCANNING MICROSCOPE FOR MICRON/SUBMICRON-SCALE DEFORMATION MEASUREMENT
Fazil Syed, Faheem Mohammad, Luai M. Al-Hadhrami
A COMPREHENSIVE OVERVIEW OF THE LASER BASED CALIBRATION FACILITY AT MEASUREMENT STANDARDS LABORATORY
Satoru Maruyama, Kazuhisa Fusayasu
CMM CALIBRATION TOOL USING REFERENCE LASER INTERFEROMETER
Mariko Kajima, Tsukasa Watanabe, Makoto Abe, Toshiyuki Takatsuji
CALIBRATOR FOR 2D GRID PLATE USING VISION COORDINATE MEASURING MACHINE WITH LASER INTERFEROMETERS
Dong Wei, Masato Aketagawa
REALIZATION OF LENGTH TRACEABILITY BY A FEMTOSECOND OPTICAL FREQUENCY COMB
Kazuhiko Kawasaki, Shinichiro Yanaka, Kaoru Miyata, Hajime Inaba, Feng-Lei Hong
FREQUENCY MEASUREMENT OF A 532-NM IODINE-STABILIZED LASER USING AN OPTICAL FREQUENCY COMB LINKED TO UTC (NMIJ)
Yasushi Azuma, Kenji Odaka, Akira Kurokawa, Toshiyuki Fujimoto
X-RAY REFLECTIVITY MEASUEMENTS FOR DEPTH DENSITY DISTRIBUTION IN THERMAL OXIDE THIN FILM ON SILICON (100)
Steffen Matthias, Markus Kastner, Eduard Reithmeier
CAMERA AND PROJECTOR CALIBRATION OF AN ENDOSCOPIC FRINGE PROJECTION SYSTEM
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