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A. Moschitta, P. Carbone, D. Petri

Statistical Performance of Gaussian ADC Histogram Test

F. Attivissimo, N. Giaquinto, M. Savino

EVALUATING MEASUREMENT UNCERTAINTY IN A/D CONVERTERS WITH AND WITHOUT DITHER

Jan Holub, Milan Komárek, Jiří Macháček, Josef Vedral

STEP-GAUSS STOCHASTIC TESTING METHOD APPLICATION FOR TRANSPORTABLE REFERENCE ADC DEVICE

D. Dallet, Ch. Rebai, V. L. Boun, D. Elfersi, A. Merino, Ph. Marchegay

Adaptive Filtering For ADC Spectral Analysis

Tomas Andersson, Peter Händel

IEEE standard 1057, Cramér-Rao bound and the parsimony principle

P. A. Traverso, G. Pasini, D. Mirri, F. Filicori, G. Iuculano

EXPERIMENTAL VALIDATION OF A GENERAL-PURPOSE NON-LINEAR DYNAMIC MODEL FOR S/H-ADC DEVICES

E. Nunzi, P. Carbone, D. Petri

A Risks Assessment and Conformance Testing of Analog–to–Digital Converters

Salvatore Nuccio, Ciro Spataro, Giovanni Tinè

ELECTROMAGNETIC IMMUNITY OF A PORTABLE PC-BASED MEASUREMENT INSTRUMENT

Salvatore Nuccio, Ciro Spataro

EVALUATION OF THE MEASUREMENT UNCERTAINTY OF PC-BASED INSTRUMENTS BY USING THE EFFECTIVE NUMBER OF BITS

F. Adamo, F. Attivissimo, N. Giaquinto, I. Kale

MEASURING DYNAMIC NONLINEARITY OF A/D CONVERTERS VIA SPECTRAL METHODS

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