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U. Paul Kumar, Basanta Bhaduri, N. Krishna Mohan, M. P. Kothiyal

Two wavelength microscopic TV interferometric system for surface profiling

R. Elansezhian, B. Ramamoorthy, P. Kesavan Nair

Effect of surfactants on the surface roughness of electroless Ni-P coating

R. Raghunandan, P. V. Rao

An approach to estimate the sample size based on surface roughness for flatness error measurement using CMM

N. Ravichandran

Total quality control

Jia Ren, Jiqin Duan, Yang Dong

Application and Uncertainty Analysis of a New Balance used in Natural Gas Primary Standard up to 60bar

D. V. Silva, M. J. Sampaio, C. Milagres, V. Alves, F. Ferreira

Flow4Link - The flow in the hand

Young-Cheol Ha, Myoung-Seok Kwak, Woong Kang

A New Gravimetric Primary Standard for Natural Gas Flow Measurement at KOGAS

Albert Weckenmann

Manufacturing metrology – State of the art and prospects

V. Radhakrishnan

Challenges in surface metrology

Optical measuring technologies and laser systems for industrial applications

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