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VIM AND CURRENT TENDENCIES IN MEASUREMENT SCIENCE
A. Chunovkina, K. Sapozhnikova, R. Taymanov
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Abstract:Some proposals with regard to the future version of the VIM are given. The proposals concern definitions of the terms "measurement", "nominal property", "metrological traceability", "sensor", "measuring system", etc. A necessity to apply measurements to new fields and take into account new technologies is grounded.
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Keywords:VIM, measurement, nominal property, metrological traceability, sensor, measuring system
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Download:
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DOI:_unreg_wc-2012.TC7-O1
Event details:
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IMEKO TC:
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Event name:XX IMEKO World Congress
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Title:
Metrology for Green Growth
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Place:Busan, REPUBLIC of KOREA
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Time:09 September 2012 - 12 September 2012