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USING OF PULSE SIGNAL Sinx/x FOR DAC TESTING

Josef Vedral, Pavel Fexa
  • Abstract:
    In this paper the qualities of short methods for testing dynamical parameters internal ADCs and DACs with impulses Multi-Tone and Sinx/x signal are analyzed. Practically examples are compared with standard Single-Tone Fourier Transform Test Method. This methods finds an application in the industry in less demanding economical short testing.
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  • DOI:
    _unreg_iwadc-2011.13

Event details:

  • IMEKO TC:
    TC4
  • Event name:
    IWADC 2011
  • Title:

    16th IMEKO International Workshop on ADC Modeling and Testing - Data Converter Design, Modeling and Testing (together with IEEE ADC Forum) (IWADC)

  • Place:
    Orvieto, ITALY
  • Time:
    30 June 2011 - 01 July 2011