UNCERTAINTY ESTIMATION OF LATTICE PARAMETERS MEASURED BY X-RAY DIFFRACTION

• Abstract:

  Abstract: The uncertainties in lattice parameters determination, for X-Ray Diffractometers with Bragg- Brentano geometry, were estimated according GUM recommendations using the Monte Carlo simulation approach. The analyzed specimen was a Corundum NIST 1976 SRM Standard. Misalignment of instrument (zero 2theta offset and peak position) is an important error source, and should be kept (2θ) < 0.015° to be able to perform lattice parameters measurements with an accuracy = 0.0001 Angstrons. Sample displacement is in general the main source of error, and the above mentioned misalignment of instrument (0.015°) only becomes dominant as error source if the sample displacement is very small (<10 µm). The analysis showed that sample absorption (Corundum) is negligible as error source, if compared with sample displacement and equipment misalignment. Other possible sources of systematic error are discussed.
• Keywords:

  lattice parameters, X-Ray diffraction, error estimative, GUM, diffractometers
• Download:

  PWC-2006-TC8-008u.pdf
• DOI:

  _unreg_wc-2006.TC8-008

Event details: