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UNCERTAINTIES OF MULTI SENSORS CMM MEASUREMENTS APPLIED TO HIGH QUALITY SURFACES

Jean Marc Linares, Jean Mailhé, Jean Michel Sprauel
  • Abstract:
    A statistical approach, based on a maximum likelihood criterion, is used to define the uncertainties of the derived element associated to a set of measured coordinates. The method is applied to high quality surfaces of low extent.
  • Keywords:
    Uncertainties, Measurement
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  • DOI:
    _unreg_wc-2006.TC21-024

Event details:

  • IMEKO TC:
  • Event name:
    XVIII IMEKO World Congress
  • Title:

    Metrology for a Sustainable Development

  • Place:
    Rio de Janeiro, BRAZIL
  • Time:
    17 September 2006 - 22 September 2006