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TOWARD A STANDARDIZED MULTI-SINEWAVE FIT ALGORITHM

Tomas Andersson, Peter Händel
  • Abstract:
    Multi-sinewave test methods require algorithms for multiple-tone parameter estimation. There exist a vast amount of imeko_proceedings on the topic. This paper presents a generalization of the IEEE four-parameter sinewave fit algorithm suitable to handle data comprising multiple sinewaves. The proposed method directly estimates the 3 p + 1 parameters of a p-tone model. The algorithm is analyzed numerically with emphasize on its convergence properties and statistical efficiency. The initialization of the algorithm is of major importance and an attempt to formulate a proper initialization procedure is presented.
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  • DOI:
    _unreg_tc4-2004.059

Event details:

  • IMEKO TC:
    TC4
  • Event name:
    TC4 Symposium 2004
  • Title:
    XIII IMEKO TC4 International Symposium on Measurements for Research and Industrial Applications (together with IXth International Workshop on ADC Modeling and Testing, IWADC)
  • Place:
    Athens, GREECE
  • Time:
    29 September 2004 - 01 October 2004