THE I-V CHARACTERISTIC COMPARISON METHOD IN ELECTRONIC COMPONENT DIAGNOSTICS

• Abstract:

  I-V characteristics of individual electronic components or electronic circuits have been playing a very important role in diagnostics for many years. The latest technological advance has extended the analytical potential of that method even more. This paper presents some examples how the I-V characteristic comparison can reveal the differences between the chosen approved model component and some other alternative components manufactured by different producers. The differences might be caused also with a treatment history like thermal or electrostatic discharge exposition.
• Keywords:

  I-V characteristic, scan profile, pin print, comparison criteria, model component
• Download:

  IMEKO-WC-2012-TC10-P2.pdf
• DOI:

  _unreg_wc-2012.TC10-P2

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