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TESTING VLSI CIRCUIT USING ARTIFICIAL IMMUNE SYSTEM

C. P. Souza, R. C. S. Freire, F. M. Assis
  • Abstract:
    A VLSI circuit test scheme taking inspiration from the Human Immune System is presented. Such a scheme is based on the Negative-Selection Mechanism which provides the human body with the capability to discriminate between the self (body’s own cell) and any foreign cell (non-self). Based on this, it is design a output response analyzer which is able to evaluate is the circuit is faulty. Experimental results showing the effectively of the proposed scheme are presented.
  • Keywords:
    VLSI circuit testing, output response analyzer, artificial immune system
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  • DOI:
    _unreg_wc-2006.TC10-002

Event details:

  • IMEKO TC:
  • Event name:
    XVIII IMEKO World Congress
  • Title:

    Metrology for a Sustainable Development

  • Place:
    Rio de Janeiro, BRAZIL
  • Time:
    17 September 2006 - 22 September 2006