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TESTING ADCs FOR STATIC AND DYNAMIC NONLINEARITIES - KILLING TWO BIRDS WITH ONE STONE

Carsten Wegener, Michael Peter Kennedy
  • Abstract:
    Traditionally, static linearity and dynamic distortion tests are performed separately for ADCs. To this end, a low-frequency sinewave is histogrammed to measure static Integral Nonlinearity, and a high-frequency sine-wave is sampled for FFT processing to measure dynamic distortions and dynamic range.
    We propose to use a model-based technique to extract both static and dynamic nonlinearities from a single data record of a sampled high-frequency sine-wave. This saves test time as the ADC converts fewer samples.
  • Keywords:
    ADC testing, histogram, FFT, static and dynamic nonlinearities
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  • DOI:
    _unreg_tc4-2002.058

Event details:

  • IMEKO TC:
    TC4
  • Event name:
    TC4 Conference and Workshop 2002
  • Title:
    4th International Conference on Advanced A/D and D/A Conversion Techniques and their Applications (together with 7th IMEKO TC4 Workshop on ADC Modelling and Testing)
  • Place:
    Prague, CZECH REPUBLIC
  • Time:
    26 June 2002 - 28 June 2002