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SYSTEM FOR TESTING ANALOG-TO-DIGITAL CONVERTERS

Daniel Belega
  • Abstract:
    This paper presents a system named "ADC TEST" that estimates the static and dynamic parameters of an analog-to-digital converter according to the definitions given in IEEE Standard 1241. One shows the available output graphical pages with theirs information and facilities in a practical testing application.
  • Keywords:
    estimation of ADC static and dynamic parameters, testing of ADCs by interpolated fast Fourier transform, windowing
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  • DOI:
    _unreg_tc4-2002.031

Event details:

  • IMEKO TC:
    TC4
  • Event name:
    TC4 Conference and Workshop 2002
  • Title:
    4th International Conference on Advanced A/D and D/A Conversion Techniques and their Applications (together with 7th IMEKO TC4 Workshop on ADC Modelling and Testing)
  • Place:
    Prague, CZECH REPUBLIC
  • Time:
    26 June 2002 - 28 June 2002