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SURFACE TOPOGRAPHY REPRESENTATION IN PROFILOMETRY
M. Wieczorowski, A. Cellary, J. Chajda
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Abstract:In the paper the authors presented a comparison analysis of three different probes used for surface topography measurement. Skid and skidless stylus probes were used as contact pick-ups, while an optical autofocussing pick-up was applied as a non-contact one. The analysis was performed using several different topography parameters. It showed that a skid causes some relatively small distortions as far as the surface representation is concerned. The optical probe on the other hand proved to be a very difficult measuring tool, particularly for surfaces with steep slopes and sharp edges. Yet even for very smooth surfaces a great attention must be paid while measuring with this kind of pick-up is considered.
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Keywords:surface topography, profilometry, probes
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Download:
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DOI:_unreg_wc-2000.409
Event details:
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IMEKO TC:
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Event name:XVI IMEKO World Congress
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Title:
Measurement - Supports Science - Improves Technology - Protects Environment ... and Provides Employment - Now and in the Future
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Place:Vienna, AUSTRIA
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Time:25 September 2000 - 28 September 2000