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STATIC CHARACTERIZATIONS OF ANALOG TO DIGITAL CONVERTER

Patrick Espel, Andre Poletaeff
  • Abstract:
    This paper deals with the assessment of the metrological performance of analog-to-digital converters in order to use them in some metrology applications. Hence, digitizers of a commercial DVM have been characterized under DC voltages, with respect of several parameters such as aperture time, dead time and the autozero function.
  • Keywords:
    digitizers, aperture time, sampling techniques
  • DOI:
    _unreg_wc-2009.138

Event details:

  • IMEKO TC:
  • Event name:
    XIX IMEKO World Congress
  • Title:

    Fundamental and Applied Metrology

  • Place:
    Lisbon, PORTUGAL
  • Time:
    06 September 2009 - 11 September 2009