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STATIC CHARACTERIZATIONS OF ANALOG TO DIGITAL CONVERTER
Patrick Espel, Andre Poletaeff
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Abstract:This paper deals with the assessment of the metrological performance of analog-to-digital converters in order to use them in some metrology applications. Hence, digitizers of a commercial DVM have been characterized under DC voltages, with respect of several parameters such as aperture time, dead time and the autozero function.
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Keywords:digitizers, aperture time, sampling techniques
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Download:
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DOI:_unreg_wc-2009.138
Event details:
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IMEKO TC:
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Event name:XIX IMEKO World Congress
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Title:
Fundamental and Applied Metrology
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Place:Lisbon, PORTUGAL
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Time:06 September 2009 - 11 September 2009