SINE WAVE SIGNAL SOURCES FOR TESTING HIGH-SPEED HIGH-RESOLUTION A/D CONVERTERS

• Abstract:

  The paper deals with conception of a sine wave signal generation for dynamic testing high-speed (1 MSa/s to 100 MSa/s) analog-to-digital converters with high-resolution (14 to 20 bits). An oscillator designed with respect to minimal phase noise is described.
• Keywords:

  ADC testing, phase noise, SINAD, THD
• Download:

  IMEKO-WC-2009-TC4-484.pdf
• DOI:

  _unreg_wc-2009.484

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