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SINE-WAVE SIGNAL SOURCES FOR DYNAMIC TESTING HIGH-RESOLUTION HIGH-SPEED ADCs

Milan Komarek, Vaclav Papez, Jaroslav Roztocil, Petr Suchanek
  • Abstract:
    The paper deals with methods of a sine-wave signal generation for dynamic testing high-speed (1 MSa/s to 100 MSa/s) ADCs with high resolution (14 to 20 bits). The techniques of noise and distortion measurement of spectrally-pure sine-wave signals are also discussed.
  • Keywords:
    sine-wave signal distortion measurement, dynamic ADC testing
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  • DOI:
    _unreg_wc-2006.TC4-IWADC-003

Event details:

  • IMEKO TC:
  • Event name:
    XVIII IMEKO World Congress
  • Title:

    Metrology for a Sustainable Development

  • Place:
    Rio de Janeiro, BRAZIL
  • Time:
    17 September 2006 - 22 September 2006