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REPRODUCIBILITY OF THE JITTER MEASUREMENT

J. Halámek, M. Kasal, M. Villa, P. Cofrancesco
  • Abstract:
    The validity of the ADC noise model and jitter error are discussed and tested by measurement.
  • Keywords:
    ADC measurement, ADC noise, jitter
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  • DOI:
    _unreg_wc-2000.620

Event details:

  • IMEKO TC:
  • Event name:
    XVI IMEKO World Congress
  • Title:

    Measurement - Supports Science - Improves Technology - Protects Environment ... and Provides Employment - Now and in the Future

  • Place:
    Vienna, AUSTRIA
  • Time:
    25 September 2000 - 28 September 2000