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PARAMETER DESIGN FOR METROLOGICAL CHARACTERISTICS IMPROVEMENT OF A FAST DIGITAL INTEGRATOR AT CERN

Pasquale Arpaia, David Giloteaux, Giuseppe Lucariello, Giovanni Spiezia
  • Abstract:
    The reduction of uncertainty in measurement systems is usually obtained through the use of more accurate components. In this paper, this problem is faced by a statistical parameter design procedure. The proposed method is shown to be effective to improve the metrological characteristics of a Fast Digital Integrator developed at European Centre of Nuclear Research.
  • Keywords:
    uncertainty reduction, parameter design, fast digital integrator
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  • DOI:
    _unreg_wc-2006.TC4-036

Event details:

  • IMEKO TC:
  • Event name:
    XVIII IMEKO World Congress
  • Title:

    Metrology for a Sustainable Development

  • Place:
    Rio de Janeiro, BRAZIL
  • Time:
    17 September 2006 - 22 September 2006