OPTIMIZATION METHODS IN METROLOGY OF ELECTRICAL QUANTITIES

• Abstract:

  In electrical quantities metrology numerous examples of stochastic processes exist and a need for optimal solutions is posed. Here stochastic genetic algorithm optimization is used for solving two typical metrological problems: errors minimization in process of instrument’s design and predicting metrological reference standards time-drift. The first case is optimal metrological design of a combined instrument transformer and the second case is analysis of resistance standard time-drift.
• Keywords:

  optimization, genetic algorithm, electrical measurements, instrument transformer, resistance standard
• Download:

  IMEKO-WC-2015-TC21-386.pdf
• DOI:

  _unreg_wc-2015.386

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