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OPTICAL DIFFERENTIATION PHASE MEASUREMENT USING A MODIFIED MULTI-STEP BIAS-SHIFTING METHOD
Hideo Furuhashi, Yoshiyuki Uchida, Kiyofumi Matsuda, Akihiro Kono
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Abstract:An optical differentiation phase measurement system using a modified multi-step bias-shifting method is proposed. The signal obtained by multi-step bias shifting is divided into two groups in this new method. The effectiveness of the new method was demonstrated using a computer simulation.
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Keywords:phase measurement, wavefront, optical differentiation
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DOI:_unreg_wc-2006.TC2-008
Event details:
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IMEKO TC:
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Event name:XVIII IMEKO World Congress
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Title:
Metrology for a Sustainable Development
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Place:Rio de Janeiro, BRAZIL
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Time:17 September 2006 - 22 September 2006