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ON THE EVALUATION OF ADC STATIC PARAMETERS THROUGH DYNAMIC TESTING

M. Comte, F. Azaïs, S. Bernard, Y. Bertrand, M. Renovell
  • Abstract:
    Full characterization of ADC requires both a histogram-based approach and a spectral analysis to determine respectively static and dynamic parameters. This paper investigates whether static performances can be extracted from spectral analysis, in order to develop a low-cost test procedure. Results show that under appropriate test conditions, the dynamic parameters extracted from a classical FFT exhibit significant variations against ADC offset and gain errors.
  • Keywords:
    ADC testing, static and dynamic parameters, spectral analysis
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  • DOI:
    _unreg_tc4-2002.060

Event details:

  • IMEKO TC:
    TC4
  • Event name:
    TC4 Conference and Workshop 2002
  • Title:
    4th International Conference on Advanced A/D and D/A Conversion Techniques and their Applications (together with 7th IMEKO TC4 Workshop on ADC Modelling and Testing)
  • Place:
    Prague, CZECH REPUBLIC
  • Time:
    26 June 2002 - 28 June 2002