NEW APPLICATIONS OF SHAPE DESIGNED COMPLEMENTARY SIGNALS FOR TESTING OF ANALOG SECTIONS IN ELECTRONIC EMBEDDED SYSTEMS

• Abstract:

  The article concerns the implementation of shape designed complementary signals in BISTs used in mixed-signal embedded systems for testing of their analog sections. The essence of the proposed method is stimulation of the tested circuit with a complementary signal of a designed particular shape, whose parameters are matched to the nominal position of circuit transfer function poles. The paper presents results of simulation research and practical verification of the method in a microsystem based on an ADuC814 microcontroller.
• Keywords:

  electronic embedded systems, complementary signals, Built-In Self-Testers
• Download:

  IMEKO-TC1-TC7-2008-041.pdf
• DOI:

  _unreg_tc7-2008.041

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