Search Proceedings
Who we are
NANO-PROBE USING OPTICAL SENSING
K. Enami, M. Hiraki, K. Takamasu
-
Abstract:Nano-Probe System is described in this paper. Recently industrial parts have been smaller in size of sub-micrometer order. Therefore it is needed to measure such small mechanical parts in high accuracy. For this purpose we have developed nano-CMM(Coordinate Measuring Machine), whose resolution is nano-meter order. We are now developing a probe attached to nano-CMM, which is named nanop- Probe. It must be small enough and be able to detect touch of an object with high sensitivity. As a principle of nano-Probe system, we have proposed Optical Sensing System, new system that can detect displace of a metal ball and carried out basic experiment. We are making prototype. Experiment that inspects availability of Optical Sensing System is done.
-
Keywords:Coordinate Measuring Machine, probe, three dimensional nanometer measurement
-
Download:
-
DOI:_unreg_wc-2000.366
Event details:
-
IMEKO TC:
-
Event name:XVI IMEKO World Congress
-
Title:
Measurement - Supports Science - Improves Technology - Protects Environment ... and Provides Employment - Now and in the Future
-
Place:Vienna, AUSTRIA
-
Time:25 September 2000 - 28 September 2000