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NANO-PROBE USING OPTICAL SENSING

K. Enami, M. Hiraki, K. Takamasu
  • Abstract:
    Nano-Probe System is described in this paper. Recently industrial parts have been smaller in size of sub-micrometer order. Therefore it is needed to measure such small mechanical parts in high accuracy. For this purpose we have developed nano-CMM(Coordinate Measuring Machine), whose resolution is nano-meter order. We are now developing a probe attached to nano-CMM, which is named nanop- Probe. It must be small enough and be able to detect touch of an object with high sensitivity. As a principle of nano-Probe system, we have proposed Optical Sensing System, new system that can detect displace of a metal ball and carried out basic experiment. We are making prototype. Experiment that inspects availability of Optical Sensing System is done.
  • Keywords:
    Coordinate Measuring Machine, probe, three dimensional nanometer measurement
  • DOI:
    _unreg_wc-2000.366

Event details:

  • IMEKO TC:
  • Event name:
    XVI IMEKO World Congress
  • Title:

    Measurement - Supports Science - Improves Technology - Protects Environment ... and Provides Employment - Now and in the Future

  • Place:
    Vienna, AUSTRIA
  • Time:
    25 September 2000 - 28 September 2000