MEASURING OF EFFECTIVE RESOLUTION OF Σ-Δ ADC

• Abstract:

  Measurement and testing methodology for Σ-Δ Analog-to-Digital converters with nominal resolution 16 (24) bits is presented. The dependancies of effective resolution on the first notch frequency and gain are given.
• Keywords:

  ADC, testing, Σ-Δ modulation
• Download:

  IMEKO-WC-2000-EWADC-P624.pdf
• DOI:

  _unreg_wc-2000.624

Event details:

• IMEKO TC:
• Event name:

  XVI IMEKO World Congress
• Title:

  Measurement - Supports Science - Improves Technology - Protects Environment ... and Provides Employment - Now and in the Future

• Place:

  Vienna, AUSTRIA
• Time:

  25 September 2000 - 28 September 2000