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MEASUREMENT OF EFFECTIVE ELECTRON SOURCE SIZE BY USING NANO-BIPRISM

B. Cho, Y. Cho, S. Ahn, H. Lee, B. Park, C. Hwang
  • Abstract:
    The spatial coherence length of electron beam was measured by using multi-walled carbon nanotubes as an element of a nano-biprism. With decreasing the source temperature from 300 K to 78 K, the visibility of the interference fringe of emitted electrons increases by a factor of 3, and the band of the interference pattern widens by a factor of 5.
  • Keywords:
    coherence length, electron beam, biprism
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  • DOI:
    _unreg_wc-2012.SS2-O10

Event details:

  • IMEKO TC:
  • Event name:
    XX IMEKO World Congress
  • Title:

    Metrology for Green Growth

  • Place:
    Busan, REPUBLIC of KOREA
  • Time:
    09 September 2012 - 12 September 2012