MEANS FOR ENSURING SI TRACEABILITY OF MICROFORCES AND / OR MICROMASSES

• Abstract:

  Over the last period, increasing attention has been paid to measurement of small forces which play a more important role in nanotechnology and other significant areas such as MEMS (Micro-Electro-Mechanical Systems). In this respect, the development of mass standards and measurement techniques below the current limit of 1 milligram is vital to provide traceability to the SI for such measurements. The lowest traceable force realized by a deadweight standard machine is typically around the level of 1 N. The national measurement institutes (NMIs), motivated by the need for small force standards, have started to explore methods for establishing a hierarchy of SI-traceable force standards at low-force level, consisting of a primary realization, a transfer standard, and methods of dissemination to instruments.
• Keywords:

  traceability, microgram, transfer standard, microforce transducer, cantilever
• Download:

  IMEKO-TC3-2014-020.pdf
• DOI:

  _unreg_tc3-2014.020

Event details: