IMPROVEMENT OF THE TIME-INTERVAL MEASUREMENT SYSTEM PARAMETERS BY MULTIPLICATION THE NUMBER OF ITS COMPONENTS

• Abstract:

  The paper contains description of TI (Time-Interval) measurement system implemented in FPGA (Field-Programmable-Gate-Array) structure whose such parameters as measuring uncertainty and maximal intensity of registered TSs (Time-Stamp) have been improved by the multiplication the number of its components. In this research the resolution has been increased by multiple TDL (Tapped-Delay-Line) use and the maximal intensity has been increased by hardware parallel processing implementation.
• Keywords:

  FPGA, time-interval, histogram, time-stamp, tapped-delay-line
• Download:

  IMEKO-WC-2015-TC7-187.pdf
• DOI:

  _unreg_wc-2015.187

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