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IMPLEMENTING AN M-LAYER DATA MODEL
Mark Kuster
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Abstract:Recent work has proposed a metrologyinformation layer (M-Layer) to support digital systems with quantities and units by addressing the difficulties conventional quantity-unit systems pose for digitalization. This paper reports work toward developing the M-Layer’s current abstract conceptualization into a concrete model, working prototype, and demonstration software, with the eventual goal to create a FAIR (findable, accessible, interoperable, reusable) resource.
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Keywords:M-Layer, aspects, quantities, measurement units, measurement information infrastructure, digital metrology
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Download:
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DOI:tc6-2022.018
Event details:
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IMEKO TC:
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Event name:M4Dconf2022
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Title:
First International IMEKO TC6 Conference on Metrology and Digital Transformation
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Place:Berlin, GERMANY
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Time:19 September 2022 - 21 September 2022