IMPLEMENTATION OF THE BOARD-LEVEL OSCILLATION BUILD-IN SELF-TEST SCHEME FOR ANALOG CIRCUITS

• Abstract:

  The paper validates oscillation built-in selftest (OBIST) scheme for testing and measuring analog circuits assembled on a printed circuit board. This scheme uses both frequency, and time domain measurements in order to maximize the fault coverage. An implementation of the OBIST that comprises designing of oscillation-test structure and a measuring system based on microcontroller is presented. Special attention is being paid to the design of oscillatory circuit in such a way that leads to the orthogonal diagnostic process.
• Keywords:

  self-testing, oscillation-test method
• Download:

  IMEKO-TC4-2002-191.pdf
• DOI:

  _unreg_tc4-symp-2002.191

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