High Reliable DAQ for ADC On Line Testing

M. Catelani, E. Campani, M. Del Pistoia, R. Singuaroli, M. Mugnaini, A. Fort

Abstract:

This paper describes a general purpose high reliable DAQ for widely used sensor families. The development of a system which allows performing fast multi-channel data acquisition and ACD testing by means of single and two tone tests grants high reliability.
Keywords:

acquisition board performance, Two tone test, ADC characterization
Download:

IMEKO-IWADC-2003-34.pdf
DOI:

_unreg_iwadc-2003.34

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