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FAST ESTIMATION OF A/D CONVERTER NONLINEARITIES

F. Stefani, A. Moschitta, D. Macii, P. Carbone, D. Petri
  • Abstract:
    This paper deals with an innovative strategy to shorten the record size required to estimate the Integral Non-Linearity (INL) of Analog-to-Digital Converters (ADC’s) through the so-called Sinewave Histogram Test (SHT). Such a size reduction is achieved by low-pass filtering the collected sequences of test samples using a simple moving average filter. After some preliminary simulations, the validity of the proposed approach have been confirmed by some experimental results.
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  • DOI:
    _unreg_iwadc-2004.004

Event details:

  • IMEKO TC:
    TC4
  • Event name:
    IWADC 2004
  • Title:

    IXth International Workshop on ADC Modeling and Testing, IWADC (together with XIII IMEKO TC4 International Symposium on Measurements for Research and Industrial Applications) (IWADC)

  • Place:
    Athens, GREECE
  • Time:
    29 September 2004 - 01 October 2004