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ENHANCED MEASUREMENT OF HIGH ASPECT RATIO SURFACES BY APPLIED SENSOR TILTING
A. Schuler, A. Weckenmann, T. Hausotte
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Abstract:During tactile surface measurements the contact point between probing tip and surface varies depending on the local surface angle. To reduce the resulting measurement deviation on high slopes a probing principle is investigated that applies a dynamic surface dependent sensor tilt. This probing process and the logics for the angle determination have been simulative evaluated. A test stand based on a nanometer coordinate measuring machine is developed and fitted with a rotation kinematic based on stacked rotary axes. Systematic positioning deviations of the kinematic are reduced by a compensation field. The test stand has been completed and results are presented.
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Keywords:profilometry, servo system, uncertainty, simulation
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Download:
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DOI:_unreg_wc-2012.SS2-O1
Event details:
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IMEKO TC:
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Event name:XX IMEKO World Congress
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Title:
Metrology for Green Growth
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Place:Busan, REPUBLIC of KOREA
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Time:09 September 2012 - 12 September 2012