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DYNAMIC CHARACTERIZATION OF A/D CONVERTERS BY RAMP TESTING SIGNALS
Daniel Belega, Dominique Dallet
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Abstract:In this paper a method for evaluation the dynamic performances of an analog-to-digital converter (ADC) by ramp testing signals is proposed. This method permits the estimation with high accuracy of ones of the most important dynamic parameters of an ADC – signal-to-noise and distortion ratio (SINAD) and effective number of bits (ENOB). Carried out simulations confirm that the proposed method leads to accurate results.
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Keywords:ramp signals, modulo time-plot, estimation of the dynamic parameters SINAD and ENOB of an ADC
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DOI:_unreg_wc-2006.TC4-IWADC-001
Event details:
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IMEKO TC:
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Event name:XVIII IMEKO World Congress
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Title:
Metrology for a Sustainable Development
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Place:Rio de Janeiro, BRAZIL
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Time:17 September 2006 - 22 September 2006