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DYNAMIC CHARACTERIZATION OF A/D CONVERTERS BY RAMP TESTING SIGNALS

Daniel Belega, Dominique Dallet
  • Abstract:
    In this paper a method for evaluation the dynamic performances of an analog-to-digital converter (ADC) by ramp testing signals is proposed. This method permits the estimation with high accuracy of ones of the most important dynamic parameters of an ADC – signal-to-noise and distortion ratio (SINAD) and effective number of bits (ENOB). Carried out simulations confirm that the proposed method leads to accurate results.
  • Keywords:
    ramp signals, modulo time-plot, estimation of the dynamic parameters SINAD and ENOB of an ADC
  • DOI:
    _unreg_wc-2006.TC4-IWADC-001

Event details:

  • IMEKO TC:
  • Event name:
    XVIII IMEKO World Congress
  • Title:

    Metrology for a Sustainable Development

  • Place:
    Rio de Janeiro, BRAZIL
  • Time:
    17 September 2006 - 22 September 2006