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DIGITAL TO ANALOG CONVERTERS: A METROLOGICAL OVERVIEW

E. Balestrieri, P. Daponte, S. Rapuano
  • Abstract:
    In the last years the technology improvement of Digital-to-Analog Converters (DACs) has extended the use of digital techniques in a multitude of applications. Consequently, there is an increasing attention to DAC topics, from researchers and manufacturers. The paper is aimed at providing a metrological overview and the leading trends of the research in the field of DACs.
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  • DOI:
    _unreg_iwadc-2004.010

Event details:

  • IMEKO TC:
    TC4
  • Event name:
    IWADC 2004
  • Title:

    IXth International Workshop on ADC Modeling and Testing, IWADC (together with XIII IMEKO TC4 International Symposium on Measurements for Research and Industrial Applications) (IWADC)

  • Place:
    Athens, GREECE
  • Time:
    29 September 2004 - 01 October 2004