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DEVELOPING THE SIGMA-DELTA A-D FOR PRECISION DC&LF METROLOGY

John Pickering
  • Abstract:
  • Keywords:
    ADC, sigma delta, metrology, precision
  • Download:
  • DOI:
    _unreg_tc4-2002.043

Event details:

  • IMEKO TC:
    TC4
  • Event name:
    TC4 Conference and Workshop 2002
  • Title:
    4th International Conference on Advanced A/D and D/A Conversion Techniques and their Applications (together with 7th IMEKO TC4 Workshop on ADC Modelling and Testing)
  • Place:
    Prague, CZECH REPUBLIC
  • Time:
    26 June 2002 - 28 June 2002