DEVELOPING MODEL-BASED DESIGN EVALUATION FOR ALGORITHMIC A/D CONVERTERS

• Abstract:

  In this paper we propose a novel Design Evaluation concept suitable for Nyquist-rate A/D converters employing the recently introduced technique of LEMMA (Linear Error Mechanism Modeling Algorithm). The core of our methodology is a root-cause identification of the error sources present in the ADC structure, evaluating the performance degradation by static non-linearity in a series of consecutive steps. Our solution benefits a wide scale of design optimization and device calibration possibilities, as it is demonstrated on a design example of Switched-Current (SI) algorithmic ADC. The results introduced in this paper are proven by full-transistor level and behavioral ADC simulation, back-annotating the parameters of its basic circuit element (SI memory cell) from the measurement of available silicon samples.
• Keywords:

  Design Evaluation, analog testing, error mechanism, linear modeling, Switched-Current, Nyquistrate A/D converter
• Download:

  PWC-2006-TC4-IWADC-005u.pdf
• DOI:

  _unreg_wc-2006.TC4-IWADC-005

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