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DESIGN OF THE PROTOTYPE OF PLD AUTO TEST PLATFORM

Senzu Shen, Hua Li, Zhengle Shi, Minghu Zhang, Qian Liu
  • Abstract:
    There're mainly two different situations for testing PLD (Programmable Logic Device) devices. One is testing of blank chips that haven't been programmed; the other is testing of ASIC (Application Specific Integrated Circuit) devices that have been programmed. This paper presents a test method for programmed ASIC devices, including auto test and ATPG (Auto Test Pattern Generation) method for both known and unknown logics of programmed ASIC devices.
  • Keywords:
    PLD, auto test, ATPG
  • Download:
  • DOI:
    _unreg_wc-2009.085

Event details:

  • IMEKO TC:
  • Event name:
    XIX IMEKO World Congress
  • Title:

    Fundamental and Applied Metrology

  • Place:
    Lisbon, PORTUGAL
  • Time:
    06 September 2009 - 11 September 2009